LIBS Info: Element Analysis
| Title | Authors | Material | Detector | Spectrometer | Software |
|---|---|---|---|---|---|
| Rapid Lead (Pb) Analysis of Solder Plating on Semiconductor Leadframes | N/A | Semiconductor | RT100-B | RT100-B | |
| Laser: | Nd:YAG 1064.0000nm 50.0000mJ NoneHz |
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| Gate Delay: | Noneus | ||||
| Gate Width: | Noneus | ||||
| Application note compares analysis of Semiconductor Leadframes for Pb using ICP-OES, Atomic Absorption, Energy Dispersive XRF (EDXRF), micro-EDXCR, LA-ICPMS and LIBS. | |||||
| Element | Detection Limit (ppm) | Wavelength (nm) | Other Wavelengths (nm) | Calibration Method | Calibration Range (ppm) | Notes |
|---|---|---|---|---|---|---|
| Pb | 22.0000 (Minimum Result) | 405.7900 | N/A | Calibration Curve | 36.0000-960.0000 | Pb detection limit may be lower. 22ppm is the lowest value shown in the paper. |
| Element | RMSE (ppm) | Wavelength (nm) | Calibration Method | Notes |
|---|