LIBS Info: Element Analysis

Title Authors Material Detector Spectrometer Software
Simultaneous determination of La, Ce, Pr, and Nd elements in aqueous solution using surfaceenhanced laser-induced breakdown spectroscopy Rongxing Yi, Y.F. Lu, X.Y. Zeng, X.Y. Li, L.B. Guo, J.M. Li, Rongxing Yi, Meng Shen, Z.Q. Hao, Xin Yan Yang Liquids ICCD Not Known
Laser: Nd:YAG
532.0000nm
60.0000mJ
NoneHz
Gate Delay: 1.000us
Gate Width: 2.000us
The authors compare the LODs for analysis of liquid samples dried onto Filter paper and Zn Metal Substrate [Surface Enhanced LIBS]
Element Detection Limit (ppm) Wavelength (nm) Other Wavelengths (nm) Calibration Method Calibration Range (ppm) Notes
Nd 4.4800 (Calibration Curve Slope) 406.1000 N/A Univariate 3.3800-56.2500 Solutions were dried on Zn substrate [Surface Enhanced] (concentrating the solution) before analysis
Nd 10.9200 (Calibration Curve Slope) 406.1000 N/A Univariate 3.3800-56.2500 Solutions were dried on Filter Paper (concentrating the solution) before analysis
Pr 0.7300 (Calibration Curve Slope) 422.2900 N/A Univariate 1.1300-18.7900 Solutions were dried on Zn substrate [Surface Enhanced] (concentrating the solution) before analysis
Pr 1.6300 (Calibration Curve Slope) 422.2900 N/A Univariate 1.1300-18.7900 Solutions were dried on Filter Paper (concentrating the solution) before analysis
Ce 3.1100 (Calibration Curve Slope) 418.6600 N/A Univariate 11.0400-184.0300 Solutions were dried on Zn substrate [Surface Enhanced] (concentrating the solution) before analysis
Ce 12.8700 (Calibration Curve Slope) 418.6600 N/A Univariate 11.0400-184.0300 Solutions were dried on Filter Paper (concentrating the solution) before analysis
La 0.6100 (Calibration Curve Slope) 394.9100 N/A Univariate 6.0000-100.0000 Solutions were dried on Zn substrate [Surface Enhanced] (concentrating the solution) before analysis
La 1.9000 (Calibration Curve Slope) 394.9100 N/A Univariate 6.0000-100.0000 Solutions were dried on filter paper (concentrating the solution) before analysis


Element RMSE (ppm) Wavelength (nm) Calibration Method Notes